Serial section scanning electron microscopy (S 3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues

PLoS ONE

Volumn 7, Issue 4, 2012, Pages

  Horstmann, Heinz ^a   Körber, Christoph ^a   Sätzler, Kurt ^b   Aydin, Daniel ^a   Kuner, Thomas ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b UNIVERSITY OF ULSTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; SILICON WAFER; UNCLASSIFIED DRUG;

ANIMAL CELL; ANIMAL TISSUE; ARTICLE; CONTROLLED STUDY; IMAGE ANALYSIS; INTERMETHOD COMPARISON; MEMBRANE STRUCTURE; NERVE ENDING; NONHUMAN; RAT; SCANNING ELECTRON MICROSCOPY; SYNAPSE; SYNAPTIC TRANSMISSION; TISSUE SECTION; TRANSMISSION ELECTRON MICROSCOPY; ANIMAL; BRAIN STEM; METHODOLOGY; SPRAGUE DAWLEY RAT; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE;

ANIMALS; BRAIN STEM; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION; RATS; RATS, SPRAGUE-DAWLEY; SILICON; SYNAPSES;

EID: 84859813369     PISSN: None     EISSN: 19326203     Source Type: Journal    
DOI: 10.1371/journal.pone.0035172     Document Type: Article

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