Automated in-chamber specimen coating for serial block-face electron microscopy

Journal of Microscopy

Volumn 250, Issue 2, 2013, Pages 101-110

  Titze, B ^a   Denk, W ^a  

^a MAX PLANCK INSTITUTE FOR MEDICAL RESEARCH   (Germany)

Author keywords

Beam deceleration; Block face imaging; Charge elimination; Charging; Coating; SBEM; SEM

Indexed keywords

COATINGS; ELECTRIC FIELDS; ELECTRONS; EVAPORATORS; ION BEAMS; SIGNAL TO NOISE RATIO;

BEAM DECELERATIONS; BLOCK-FACE IMAGING; CHARGE ELIMINATION; CHARGING; CHARGING EFFECT; INSULATING SPECIMENS; NEGATIVE CHARGE; SCANNING ELECTRONS; SERIAL BLOCK-FACE ELECTRON MICROSCOPY; SIGNAL IMAGES;

SCANNING ELECTRON MICROSCOPY;

PALLADIUM;

ANATOMICAL CONCEPTS; ARTICLE; AUTOMATION; CHEMICAL REACTION; CONDUCTANCE; DECELERATION; DEGRADATION; ELECTRIC FIELD; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; ION CURRENT; MATERIAL COATING; OXIDATION; PRIORITY JOURNAL; SERIAL BLOCK FACE ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; SURFACE CHARGE; VACUUM;

EID: 84876072880     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12023     Document Type: Article

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