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Volumn 9, Issue 3, 2015, Pages 2938-2947

Depth-sensitive subsurface imaging of polymer nanocomposites using second harmonic Kelvin probe force microscopy

Author keywords

AFM; CNT; depth sensitive; nanocomposites; polymer; second harmonic; subsurface

Indexed keywords

HARMONIC ANALYSIS; IMAGE RESOLUTION; NANOCOMPOSITE FILMS; POLYMERS; PROBES; SINGLE-WALLED CARBON NANOTUBES (SWCN); SOLVENTS;

EID: 84925625571     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn507019c     Document Type: Article
Times cited : (53)

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