Numerical simulations of electrostatic interactions between an atomic force microscopy tip and a dielectric sample in presence of buried nano-particles

Journal of Applied Physics

Volumn 112, Issue 11, 2012, Pages

  Arinero, R ^a   Riedel, C ^a,b   Guasch, C ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTABILITY; DIELECTRIC PERMITTIVITIES; ELECTROSTATIC FORCE MICROSCOPY; EQUIPOTENTIAL LINES; FINITE ELEMENT MODELING; LOCAL ELECTRIC FIELD; NANO SCALE;

ATOMIC FORCE MICROSCOPY; DIELECTRIC FILMS; ELECTRIC FIELDS; FINITE ELEMENT METHOD; PARTICLE SIZE ANALYSIS; PERMITTIVITY;

NANOPARTICLES;

EID: 84871229813     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4768251     Document Type: Article

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