Lattice strain at c-Si surfaces: A density functional theory calculation

Metrologia

Volumn 52, Issue 2, 2015, Pages 214-221

  Melis, C ^a   Colombo, L ^a   Mana, G ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

Author keywords

determination of fundamental constants; mechanical properties; structure of clean surfaces (and surface reconstruction); surface strains; units and standards

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL STRUCTURE; LATTICE THEORY; MECHANICAL PROPERTIES; SILICON; STRAIN; SURFACE RECONSTRUCTION;

AVOGADRO CONSTANT; CLEAN SURFACES; CRYSTAL SURFACES; FUNDAMENTAL CONSTANTS; OXIDATION PROCESS; STRAIN COMPONENTS; SURFACE RELAXATION AND RECONSTRUCTION; SURFACE STRAINS;

DENSITY FUNCTIONAL THEORY;

EID: 84924350991     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/52/2/214     Document Type: Article

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