Infrared spectrometric measurement of impurities in highly enriched 'Si28'

Metrologia

Volumn 48, Issue 2, 2011, Pages

  Zakel, S ^a   Wundrack, S ^a   Niemann, H ^a   Rienitz, O ^a   Schiel, D ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION COEFFICIENTS; ABSORPTION MEASUREMENTS; AVOGADRO CONSTANT; BORON ATOM; CALIBRATION FACTORS; IMPURITIES IN; INFRARED SPECTROMETRY; INTERSTITIAL SITES; ISOTOPIC ABUNDANCES; ISOTOPICALLY ENRICHED; ISOTOPICALLY ENRICHED SILICON; LATTICE PARAMETERS; OXYGEN ATOM; SPECTROMETRIC MEASUREMENTS; STANDARDIZED PROCEDURE;

ABSORPTION; BORON; BORON COMPOUNDS; INFRARED SPECTROSCOPY; OXYGEN; SPECTROMETRY;

CRYSTAL IMPURITIES;

EID: 79953689034     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/48/2/S02     Document Type: Article

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