Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer

Metrologia

Volumn 48, Issue 2, 2011, Pages

  Massa, E ^a   Mana, G ^a   Kuetgens, U ^b   Ferroglio, L ^a  

^a ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AVOGADRO CONSTANT; LATTICE PLANE; OPTICAL INTERFEROMETRY; RELATIVE ACCURACY; SI CRYSTALS; SILICON ATOMS; X-RAY INTERFEROMETERS;

SILICON;

EID: 79953697141     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/48/2/S06     Document Type: Article

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