The lattice parameter of the 28Si spheres in the determination of the Avogadro constant

Metrologia

Volumn 48, Issue 2, 2011, Pages

  Massa, E ^a   Mana, G ^a   Ferroglio, L ^a   Kessler, E G ^b   Schiel, D ^c   Zakel, S ^c  

^a ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AVOGADRO CONSTANT; LATTICE PARAMETERS; ORDERED ARRANGEMENT; UNIT-CELL VOLUME;

LATTICE CONSTANTS;

SPHERES;

EID: 79953675734     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/48/2/S07     Document Type: Article

References (19)

1. Becker P, Friedrich H, Fujii K, Giardini W, Mana G, Picard A, Pohl H-J, Riemann H and Valkiers S 2009 The Avogadro constant determination via enriched silicon-28 Meas. Sci. Technol. 20 092002
2. 28Si crystal Phys. Rev. Lett. 106 030801
3. 28Si crystal for a new kilogram definition Metrologia 48 S1-13
4. Kessler E G, Henins A, Deslattes R D, Nielsen L and Arif M 1994 Precision comparison of the lattice parameters of silicon monocrystals J. Res. Natl Inst. Stand. Technol. 99 1-18
5. Kessler E G, Henins A, Deslattes R D, Nielsen L and Arif M 1994 J. Res. Natl Inst. Stand. Technol. 99 85 (erratum)
6. Becker P, Cavagnero C, Kuetgens U, Mana G and Massa E 2007 Confimation of the INRiM and PTB determinations of the Si lattice parameter IEEE Trans. Instrum. Meas. 56 230-4 (Pubitemid 46541895)
7. Ferroglio L, Mana G and Massa E 2008 Si lattice parameter measurement by centimeter x-ray interferometry Opt. Express 16 6877-88
8. Massa E, Mana G and Kuetgens U 2009 Comparison of the INRIM and PTB lattice-spacing standards Metrologia 46 249-53
9. Massa E, Mana G, Kuetgens U and Ferroglio L 2009 Measurement of the lattice parameter of a silicon crystal New J. Phys. 11 053013
10. Massa E, Mana G, Kuetgens U and Ferroglio L 2010 Calibration of a silicon crystal for absolute nuclear spectroscopy J. Appl. Cryst. 43 293-6
11. 28Si x-ray interferometer Metrologia 48 S37-43
12. Becker P, Bettin H, Danzebrink H-U, Glaeser M, Kuetgens U, Nicolaus A, Schiel D, De Bièvre P, Valkiers S and Taylor P 2003 Determination of the Avogadro constant via the silicon route Metrologia 40 271-87
13. Becker P 1999 The determination of the Avogadro constant-not simply a metrological problem IEEE Trans. Instrum. Meas. 48 2259-62
14. Kessler E G Jr, Owens S M, Henins A and Deslattes R D 1999 Silicon lattice comparisons related to the Avogadro project: uniformity of new material and surface preparation effects IEEE Trans. Instrum. Meas. 48 221-4
15. Schoedel R and Bonsch G 2001 Precise interferometric measurements at single crystal silicon yielding thermal expansion coefficients from 12 °C to 28 °C and compressibility Recent Development in Traceble Dimensional Measurements ed J E Decker and N Brown Proc. SPIE 4401 54-62
16. Zakel S, Wundrack S, Niemann H, Rienitz O and Schiel D 2011 Infrared spectrometric measurement of impurities in highly enriched 'Si28' material Metrologia 48 S14-19
17. Gebauer J, Rudolf F, Polity A, Krause-Rehberg R, Martin J and Becker P 1999 On the sensitivity limit of positron annihilation: detection of vacancies in as-grown silicon Appl. Phys. A 68 411-6
18. Windisch D and Becker P 1990 Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants Phys. Status Solidi A 118 379-88 (Pubitemid 20695255)
19. 28Si Metrologia 46 416-22