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Volumn 24, Issue 2, 2015, Pages
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Etching of silicon surfaces using atmospheric plasma jets
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Author keywords
plasma etching; plasma jet machining; surface roughness
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Indexed keywords
ATMOSPHERIC CHEMISTRY;
ATMOSPHERIC PRESSURE;
ATOMIC FORCE MICROSCOPY;
ERROR CORRECTION;
MANUFACTURE;
PLASMA ETCHING;
SILICON;
SILICON WAFERS;
SURFACE ROUGHNESS;
ATMOSPHERIC PLASMAS;
CRYSTALLINE SILICONS;
JET MACHINING;
MANUFACTURING COMPLEX;
MATERIAL REMOVAL RATE;
SILICON STRUCTURES;
SURFACE PROCESSING;
WHITE-LIGHT INTERFEROMETRY;
PLASMA JETS;
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EID: 84924340596
PISSN: 09630252
EISSN: 13616595
Source Type: Journal
DOI: 10.1088/0963-0252/24/2/025002 Document Type: Article |
Times cited : (65)
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References (15)
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