Volume measurements of 28Si spheres using an interferometer with a flat etalon to determine the Avogadro constant

Metrologia

Volumn 48, Issue 2, 2011, Pages

  Kuramoto, N ^a   Fujii, K ^a   Yamazawa, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPARENT VOLUME; AVOGADRO CONSTANT; DATA ANALYSIS; DIAMETER MEASUREMENT; LASER INTERFEROMETER; OPTICAL FREQUENCY TUNING; PHASE SHIFTING INTERFEROMETRY; RELATIVE COMBINED STANDARD UNCERTAINTIES; SILICON CORES; SPHERE SURFACES; SURFACE LAYERS; X-RAY CRYSTAL DENSITY METHOD;

DATA REDUCTION; ETALONS; LASER INTERFEROMETRY; OPTICAL INSTRUMENTS; SILICON; SPHERES; UNCERTAINTY ANALYSIS;

VOLUME MEASUREMENT;

EID: 79953693608     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/48/2/S11     Document Type: Article

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