Fault detection for IGBT using adaptive thresholds during the turn-on transient

IEEE Transactions on Industrial Electronics

Volumn 62, Issue 3, 2015, Pages 1975-1983

  Rodriguez Blanco, Marco Antonio ^a   Vazquez Perez, Amsi ^a   Hernandez Gonzalez, Leobardo ^b   Golikov, Victor ^a   Aguayo Alquicira, Jesus ^c   May Alarcon, Manuel ^a  

^a UNIVERSIDAD AUTÓNOMA DEL CARMEN   (Mexico)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^c CENTRO NACIONAL DE INVESTIGACIÓN Y DESARROLLO TECNOLÓGICO   (Mexico)

Author keywords

Adaptable Signal Detection; Drives; electronics circuit; Failure analysis; Fault Diagnosis; Insulated Gate Bipolar Transistors; Inverter; threshold and Fault detection

Indexed keywords

ANALOG CIRCUITS; DRIVES; ELECTRIC NETWORK ANALYSIS; FAILURE ANALYSIS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); PATTERN RECOGNITION SYSTEMS; SIGNAL DETECTION;

ADAPTIVE THRESHOLDS; ANALOG ELECTRONICS; DIRECT MEASUREMENT; ELECTRONICS CIRCUITS; EXPERIMENTAL TEST; FAULT DETECTION TECHNIQUES; INVERTER; TURN-ON TRANSIENTS;

FAULT DETECTION;

EID: 84923164517     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2014.2364154     Document Type: Article

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