IGBT-gating failure effect on a fault-tolerant predictive current-controlled five-phase induction motor drive

IEEE Transactions on Industrial Electronics

Volumn 62, Issue 1, 2015, Pages 15-20

  Guzman, Hugo ^a   Barrero, Federico ^b   Duran, Mario J ^a  

^a UNIVERSITY OF MÁLAGA   (Spain)

^b UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC DRIVES; INDUCTION MOTORS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MACHINE COMPONENTS;

CURRENT CONTROLLER; ELECTRONIC COMPONENT; FAILURE EFFECTS; FAULT-TOLERANCE CAPABILITY; FIVE-PHASE INDUCTION MOTORS; FREEWHEELING DIODES; HIGH-RELIABILITY; MULTIPHASE MACHINES;

FAULT TOLERANCE;

EID: 84919935229     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2014.2331019     Document Type: Article

References (9)

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