Low-cost diagnostic method for open-switch faults in inverters

Electronics Letters

Volumn 46, Issue 14, 2010, Pages 1021-1022

  An, Q T ^a,b   Sun, L Z ^a   Sun, L ^a   Jahns, T M ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLLECTOR-EMITTER VOLTAGE; DIAGNOSTIC METHODS; EXPERIMENTAL VALIDATIONS; FAULTY CONDITION; HIGH-SPEED; LOCATION METHOD; NORMAL CONDITION; ON-LINE DIAGNOSIS; OPERATING STATE; PHOTO-COUPLERS; POWER SWITCHES; TIME INTERVAL; VOLTAGE SOURCE INVERTER;

FAULT DETECTION; LOGIC CIRCUITS; SWITCHING CIRCUITS;

COST REDUCTION;

EID: 77954598105     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el.2010.0611     Document Type: Article

References (8)

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