A new fault detection technique for IGBT based on gate voltage monitoring

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn , Issue , 2007, Pages 1001-1005

  Rodriguez M A ^a,c   Claudio, A ^a   Theilliol, D ^b   Vela, L G ^a  

^a CENTRO NACIONAL DE INVESTIGACIÓN Y DESARROLLO TECNOLÓGICO   (Mexico)

^b CENTRE DE RECHERCHE EN AUTOMATIQUE DE NANCY   (France)

^c UNIVERSIDAD AUTÓNOMA DEL CARMEN   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FILTERS; FAILURE ANALYSIS; FAULT DETECTION; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); POWER ELECTRONICS; RELIABILITY; SIGNAL PROCESSING; VOLTAGE MEASUREMENT;

FAILURE MECHANISMS; FAILURE-DETECTION; GATE VOLTAGES; PHYSICAL MODEL;

QUALITY ASSURANCE;

EID: 48349115036     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.2007.4342127     Document Type: Conference Paper

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