A fast overcurrent protection scheme for IGBT modules through dynamic fault current evaluation

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn , Issue , 2013, Pages 577-583

  Wang, Zhiqiang ^a   Shi, Xiaojie ^a   Tolbert, Leon M ^a,b   Blalock, Benjamin J ^a   Chinthavali, Madhu ^b  

^a University of Tennessee   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LIMITING; EXPERIMENTAL TEST; INDUCED VOLTAGES; PROTECTION SCHEMES; REAL COMPONENTS; RELIABLE DETECTION; STRAY INDUCTANCES; TURN-OFF MECHANISMS;

ELECTRIC FAULT CURRENTS; INDUCTANCE; POWER ELECTRONICS;

POWER QUALITY;

EID: 84879375276     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2013.6520268     Document Type: Conference Paper

References (15)

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