A failure-detection strategy for IGBT based on gate-voltage behavior applied to a motor drive system

IEEE Transactions on Industrial Electronics

Volumn 58, Issue 5, 2011, Pages 1625-1633

  Rodríguez Blanco, Marco Antonio ^a   Claudio Sánchez, Abraham ^b   Theilliol, Didier ^c   Vela Valdés, Luis Gerardo ^b   Sibaja Terán, Pedro ^a   Hernández González, Leobardo ^d   Aguayo Alquicira, Jesus ^b  

^a UNIVERSIDAD AUTÓNOMA DEL CARMEN   (Mexico)

^b CENTRO NACIONAL DE INVESTIGACIÓN Y DESARROLLO TECNOLÓGICO   (Mexico)

^c UNIVERSITÉ DE LORRAINE   (France)

^d INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

Analog circuits; driver circuits; fault location; insulated gate bipolar transistors (IGBTs); semiconductor device measurements; time delay

Indexed keywords

CIRCUIT FAILURES; DETECTION TECHNIQUE; DRIVE SYSTEMS; DRIVER CIRCUIT; EXPERIMENTAL TEST; FAULT LOCATION; IM DRIVE; INSULATED GATE BIPOLAR TRANSISTORS (IGBTS); MOTOR DRIVE SYSTEM; PROTECTION SYSTEMS; SEMICONDUCTOR-DEVICE MEASUREMENTS; SIGNAL MONITORING;

ACTIVE FILTERS; ANALOG CIRCUITS; BIPOLAR TRANSISTORS; ELECTRIC DRIVES; FAULT DETECTION; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); TIME DELAY;

DELAY CIRCUITS;

EID: 79954516751     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2010.2098355     Document Type: Article

References (35)

1. L. de Lillo, L. Empringham, P. W. Wheeler, S. Khwan-On, C. Gerada, M. N. Othman, and X. Huang, "Multiphase power converter drive for fault-tolerant machine development in aerospace application" IEEE Trans. Ind. Electron., vol. 57, no. 2, pp. 575-583, Feb. 2010.
2. Z. Sun, J. Wang, D. Howe, and G. Jewell, "Analytical prediction of short-circuit current in fault-tolerant permanent magnet machines" IEEE Trans. Ind. Electron., vol. 55, no. 12, pp. 4210-4217, Dec. 2008.
3. A. Namazi, M. Nourani, and M. Saquib, "A fault-tolerant interconnect mechanism for NMR nanoarchitectures" IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 18, no. 10, pp. 1433-1446, Oct. 2010.
4. S. Karimi, A. Gaillard, P. Poure, and S. Saadate, "FPGA-based realtime power converter failure diagnosis for wind energy conversion systems" IEEE Trans. Ind. Electron., vol. 55, no. 12, pp. 4299-4308, Dec. 2008.
5. Y. Xiong, X. Cheng, Z. J. Shen, C. Mi, H. Wu, and V. K. Garg, "Prognostic and warning system for power-electronic modules in electric, hybrid electric, and fuel-cell vehicles" IEEE Trans. Ind. Electron., vol. 55, no. 6, pp. 2268-2276, Jun. 2008.
6. S. Bolognani, M. Zordan, and M. Zigliotto, "Experimental fault-tolerant control of a PMSM drive" IEEE Trans. Ind. Electron., vol. 47, no. 5, pp. 1134-1141, Oct. 2000.
7. N. Bianchi and S. Bolognani, "Strategies for the fault-tolerant current control of five phase permanent-magnetic motor" IEEE Trans. Ind. Appl., vol. 43, no. 4, pp. 960-970, Jul./Aug. 2007. (Pubitemid 47249969)
8. B. A. Welchko, T. A. Lipo, T. M. Jahns, and S. E. Schulz, "Fault tolerant three-phase AC motor drive topologies: A comparison of features, cost, and limitations" IEEE Trans. Power Electron., vol. 19, no. 4, pp. 1108-1116, Jul. 2004.
9. R. L. A. Ribeiro, C. B. Jacobina, E. R. C. da Silva, and A. M. N. Lima, "Fault-tolerant voltage-fed PWMinverter AC motor drive systems" IEEE Trans. Ind. Electron., vol. 51, no. 2, pp. 439-446, Apr. 2004.
10. P. Barriuso, J. Dixon, P. Flores, and L. Morán, "Fault tolerant reconfiguration system for asymmetric multilevel converters using bi-directional power switches" IEEE Trans. Ind. Electron., vol. 56, no. 4, pp. 1300-1306, Mar. 2009.
11. M. A. Rodríguez, A. Claudio, D. Theillio, L. G. Vela, and L. Hernández, "Strategy to replace the damaged element for fault-tolerant induction motor drive" in Proc. IEEE Appl. Power Electron. Conf., Washington, DC, Feb. 15-19, 2009, pp. 343-346.
12. F. Zidani, D. Diallo, M. El Hachemi Benbouzid, and R. Naït-Saïd, "A fuzzy-based approach for the diagnosis of fault modes in a voltage-fed PWM inverter induction motor drive" IEEE Trans. Ind. Electron., vol. 55, no. 2, pp. 586-593, Feb. 2008. (Pubitemid 351344232)
13. J. Klima, "Analytical investigation of an induction motor drive under inverter fault mode operations" Proc. Inst. Elect. Eng.-Elect. Power Appl., vol. 150, no. 3, pp. 255-262, May 2003.
14. P. Lezana, R. Aguilera, and J. Rodríguez, "Fault detection on multicell converter based on output voltage frequency analysis" IEEE Trans. Ind. Electron., vol. 56, no. 6, pp. 2275-2283, Jun. 2009.
15. F. Richardeau, P. Baudesson, and T. A. Meynard, "Failure-tolerance and remedial strategies of a PWM multicell inverter" IEEE Trans. Power Electron., vol. 17, no. 6, pp. 905-912, Nov. 2002.
16. S. Caballos, J. Pou, E. Robles, J. Zaragoza, and J. L. Martín, "Performance evaluation of fault-tolerant neutral-point-clamped converters" IEEE Trans. Ind. Electron., vol. 57, no. 8, pp. 2709-2718, Aug. 2010.
17. T.-J. Klim, W.-C. Lee, and D. S. Hyun, "Detection method for open-circuit fault in neutral-point-clamped inverter systems" IEEE Trans. Ind. Electron., vol. 56, no. 7, pp. 2754-2763, Jul. 2009.
18. B. Lu and S. Sharma, "A survey of IGBT fault diagnostic methods for three-phase power inverters" in Proc. IEEE Int. Conf. Condition Monit. Diagnosis, Apr. 2008, pp. 756-763.
19. B. Lu and S. Sharma, "A literature review of IGBT fault diagnostic and protection methods for power inverters" IEEE Trans. Ind. Appl., vol. 45, no. 5, pp. 1770-1777, Sep./Oct. 2009.
20. W. Sleszynski, J. Nieznanski, and A. Cichowski, "Open-transistor fault diagnostics in voltage-source inverters by analyzing the load currents" IEEE Trans. Ind. Electron., vol. 56, no. 11, pp. 4681-4688, Nov. 2009.
21. R. S. Chokhawala and S. Sobhani, "Switching voltage transient protection schemes for high-current IGBT modules" IEEE Trans. Ind. Appl., vol. 33, no. 6, pp. 1601-1610, Nov./Dec. 1997. (Pubitemid 127827458)
22. R. S. Chokhawala, J. Catt, and L. Kiraly, "A discussion on IGBT shortcircuit behavior and fault protection schemes" IEEE Trans. Ind. Appl., vol. 31, no. 2, pp. 256-263, Mar./Apr. 1995.
23. R. Pagano, Y. Chen, K. Smedley, S. Musumeci, and A. Raciti, "Short circuit analysis and protection of power module IGBTs" in Proc. IEEE Appl. Power Electron. Conf., Austin, TX, Feb. 19-23, 2005, pp. 777-783. (Pubitemid 43860873)
24. F. Huang and F. Flett, "IGBT fault protection based on di/dt feedback control" in Proc. IEEE Power Electron. Spec. Conf., 2007, pp. 1913-1917.
25. B. G. Park, J.-B. Lee, D.-S. Hyun, F. Huang, and F. Flett, "A novel short-circuit detecting scheme using turn-on switching characteristic of IGBT" in Conf. Rec. IEEE IAS Annu. Meeting, Edmonton, AB, Canada, Oct. 5-9, 2008, pp. 1-5.
26. R. L. de Araujo Ribeiro, C. B. Jacobina, E. R. C. da Silva, and A. M. N. Lima, "Fault detection of open-switch damage in voltage-fed PWM motors drive systems" IEEE Trans. Power Electron., vol. 18, no. 2, pp. 587-593, Mar. 2003.
27. S. F. Farag, R. G. Bartheld, and T. G. Habetler, "Integrated on-line motor protection system" in Conf. Rec. IEEE IAS Annu. Meeting, Mar./Apr. 1996, vol. 2, pp. 21-26. (Pubitemid 126556086)
28. A. M. S. Mendes and A. J. Marques, "Voltage source inverter fault diagnosis in variable speed AC drives, by the average current Park's vector approach" in Proc. IEMDC, 1999, pp. 704-706.
29. K. Rothenhagen and F. W. Fuchs, "Performance of diagnosis methods for IGBT open circuit faults in three phase voltage source inverters for AC variable speed drives" in Proc. Eur. Conf. Power Electron. Appl., Dresden, Germany, Sep. 2005, pp. 1-10.
30. A. Aviziens, "Fault-tolerant systems" IEEE Trans. Comput., vol. C-25, no. 12, pp. 1304-1312, Dec. 1976.
31. R. Isermann, R. Schwarz, and S. Stölzl, "Fault-tolerant drive-bywire system" IEEE Control Syst. Mag., vol. 22, no. 5, pp. 64-81, Oct. 2002.
32. C. Yu, J. S. Yuan, and H. Yang, "MOSFET linearity performance degradation subject to drain and gate voltage stress" IEEE Trans. Device Mater. Rel., vol. 4, no. 4, pp. 681-689, Dec. 2004. (Pubitemid 40212321)
33. A. R. Hefner, Jr. and D. L. Blackburn, "An analytical model for the steady-state and transient characteristics of the power insulated-gate bipolar transistor" Solid State Electron., vol. 31, no. 10, pp. 1513-1532, Oct. 1988.
34. A. H. Craing, R. H. Randall, and J. Yedinak, "IGBT ghost failures in boost topology circuits explained through third quadrant operation" in Proc. IEEE Appl. Power Electron. Conf., New Orleans, LA, 2000, vol. 2, pp. 1103-1108. (Pubitemid 30584344)
35. M. Trivedi and K. Shenai, "Failure mechanisms of IGBT's under short-circuit and clamped inductive switching stress" IEEE Trans. Power Electron., vol. 14, no. 1, pp. 108-115, Jan. 1999.