Real-Time IGBT open-circuit fault diagnosis in three-level neutral-point-clamped voltage-source rectifiers based on instant voltage error

IEEE Transactions on Industrial Electronics

Volumn 62, Issue 3, 2015, Pages 1669-1678

  Caseiro, Luis M A ^a   Mendes, André M S ^a  

^a UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

Fault detection; fault diagnosis; fault location; multilevel converters; neutral point clamped (NPC); rectifiers; reliability; semiconductor device breakdown

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; ELECTRIC FAULT LOCATION; ELECTRIC RECTIFIERS; FAILURE ANALYSIS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); RECTIFYING CIRCUITS; RELIABILITY; SEMICONDUCTOR DEVICES; TIMING CIRCUITS;

FAVORABLE CONDITIONS; MODULATION STRATEGY; MULTILEVEL CONVERTER; NEUTRAL POINT CLAMPED; OPEN CIRCUIT FAULTS; REAL-TIME DIAGNOSTICS; SEMICONDUCTOR DEVICE BREAKDOWN; THREE-LEVEL NEUTRAL POINT CLAMPED;

FAULT DETECTION;

EID: 84988289931     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2014.2341558     Document Type: Article

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