A novel short-circuit detecting scheme using turn-on switching characteristic of IGBT

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn , Issue , 2008, Pages

  Park, Byoung Gun ^a   Lee, Jun Bae ^b   Hyun, Dong Seok ^a  

^a Hanyang University   (South Korea)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FILTERS; FAULT DETECTION; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); INTEGRATED CIRCUITS; SWITCHING;

GATE DRIVES; HIGH VOLTAGE INTEGRATED CIRCUITS; LOW VOLTAGES; PROTECTION CIRCUITS; SHORT-CIRCUIT FAULTS; SIMULATION RESULTS; SWITCHING CHARACTERISTICS;

ELECTRIC FAULT LOCATION;

EID: 57949113297     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/08IAS.2008.350     Document Type: Conference Paper

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