Determining charge state of graphene vacancy by noncontact atomic force microscopy and first-principles calculations

Nanotechnology

Volumn 26, Issue 3, 2015, Pages

  Liu, Y ^a   Weinert, M ^a   Li, L ^a  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

charge state; DFT; graphene vacancy; local contact potential; noncontact AFM

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; CHARGE TRANSFER; CHEMICAL SENSORS; DEFECTS; DENSITY FUNCTIONAL THEORY; ELECTRON SCATTERING; GRAPHENE; IMAGE RECONSTRUCTION;

ATOMIC-RESOLUTION IMAGING; CHARGE STATE; CONTACT POTENTIAL; CONTACT POTENTIAL DIFFERENCE; FIRST-PRINCIPLES CALCULATION; NONCONTACT AFM; NONCONTACT ATOMIC FORCE MICROSCOPY; POSITIVELY CHARGED;

VACANCIES;

EID: 84920144431     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/26/3/035702     Document Type: Article

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