Diffusion, coalescence, and reconstruction of vacancy defects in graphene layers

Physical Review Letters

Volumn 95, Issue 20, 2005, Pages

  Lee, Gun Do ^a   Wang, C Z ^c   Yoon, Euijoon ^a   Hwang, Nong Moon ^b   Kim, Doh Yeon ^b   Ho, K M ^c  

^a Seoul National University   (South Korea)

^b Seoul National University   (South Korea)

^c IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHENE LAYERS; TIGHT-BINDING MOLECULAR DYNAMICS (TBMD) SIMULATIONS; VACANCY DEFECTS;

COALESCENCE; COMPUTER SIMULATION; DEFECTS; DIFFUSION; THERMAL EFFECTS;

MOLECULAR DYNAMICS;

EID: 28844492043     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.205501     Document Type: Article

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