Self healing of defected graphene

Applied Physics Letters

Volumn 102, Issue 10, 2013, Pages

  Chen, Jianhui ^a   Shi, Tuwan ^a   Cai, Tuocheng ^a   Xu, Tao ^b   Sun, Litao ^b   Wu, Xiaosong ^a   Yu, Dapeng ^a  

^a PEKING UNIVERSITY   (China)

^b Southeast University   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON PLASMA BOMBARDMENT; CARBON AD-ATOMS; DEFECTED GRAPHENE; ELECTRICAL MEASUREMENT; ELECTRONICS APPLICATIONS; PLASMA INDUCED DAMAGE; THERMAL ANNEALING PROCESS; X RAY PHOTOEMISSION SPECTROSCOPY;

CARRIER MOBILITY; DEFECTS; PHOTOELECTRON SPECTROSCOPY; RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

EID: 84875190510     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4795292     Document Type: Article

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