Structural and electrical properties of nitrogen-doped ZnO thin films

Applied Surface Science

Volumn 318, Issue , 2014, Pages 157-163

  Tuzemen, Ebru Senadim ^a   Kara, Kamuran ^b   Elagoz, Sezai ^a   Takci, Deniz Kadir ^c   Altuntas, Ismail ^a   Esen, Ramazan ^c  

^a CUMHURIYET UNIVERSITY   (Turkey)

^b ISTANBUL UNIVERSITY   (Turkey)

^c CUKUROVA UNIVERSITY   (Turkey)

Author keywords

Optical properties; Raman spectroscopy; X ray diffraction

Indexed keywords

DEPOSITION; ENERGY GAP; II-VI SEMICONDUCTORS; METALLIC FILMS; NITROGEN; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; SEMICONDUCTOR DOPING; SUBSTRATES; THIN FILMS; VACUUM APPLICATIONS; X RAY DIFFRACTION; ZINC OXIDE;

ABSORBANCE SPECTRUM; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL STUDIES; FILTERED CATHODIC VACUUM ARC DEPOSITION; HALL EFFECT MEASUREMENT; STRUCTURAL AND ELECTRICAL PROPERTIES; STRUCTURAL QUALITIES; UV-VIS-NIR SPECTROPHOTOMETERS;

OPTICAL FILMS;

EID: 84909948571     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.02.118     Document Type: Conference Paper

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