Sub-eV ion deposition utilizing soft-landing ion mobility for controlled ion, ion cluster, and charged nanoparticle deposition

International Journal of Mass Spectrometry

Volumn 370, Issue , 2014, Pages 66-74

  Walton, Barbara L ^a   Hoffmann, William D ^a   Verbeck, Guido F ^a  

^a UNIVERSITY OF NORTH TEXAS   (United States)

Author keywords

Ion mobility; MALDI; Preparative mass spectrometry; Soft landing; Sub eV deposition; Surface enhanced Raman

Indexed keywords

EID: 84904011611     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2014.06.031     Document Type: Article

References (58)

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