Resolving the memory bottleneck for single supply near-threshold computing

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2014, Pages

  Gemmeke, Tobias ^b   Sabry, Mohamed M ^c   Stuijt, Jan ^b   Raghavan, Praveen ^a   Catthoor, Francky ^a   Atienza, David ^c  

^a IMEC   (Belgium)

^b HOLST CENTRE   (Netherlands)

^c EPFL   (Switzerland)

Author keywords

memories; Near threshold computing

Indexed keywords

DATA STORAGE EQUIPMENT; DESIGN; SILICON;

ADVANCED MONITORING; LOW-POWER PROCESSING; MEMORY BOTTLENECK; NEAR-THRESHOLD COMPUTING; RELIABILITY DEGRADATION; RUN-TIME ERRORS; SINGLE SUPPLIES; TECHNOLOGY NODES;

DIGITAL LIBRARIES;

EID: 84903852494     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.7873/DATE2014.215     Document Type: Conference Paper

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