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Volumn , Issue , 2004, Pages 55-60

SRAM leakage suppression by minimizing standby supply voltage

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BUFFER STORAGE; COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; OPTIMIZATION; STATIC RANDOM ACCESS STORAGE;

EID: 2942687683     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/isqed.2004.1283650     Document Type: Conference Paper
Times cited : (178)

References (8)
  • 1
    • 0036116743 scopus 로고    scopus 로고
    • Picoradios for wireless sensor networks: The next challenge in ultra-low-power design
    • Feb
    • J. Rabaey et al, "PicoRadios for Wireless Sensor Networks: The Next Challenge in Ultra-Low-Power Design," Proc. of ISSCC, pp. 200-201, Feb 2002.
    • (2002) Proc. of ISSCC , pp. 200-201
    • Rabaey, J.1
  • 2
    • 0036954445 scopus 로고    scopus 로고
    • Low voltage memories for power-aware systems
    • Aug.
    • K. Itoh, "Low Voltage Memories for Power-Aware Systems," Proc. ISLPED, pp. 1-6, Aug. 2002.
    • (2002) Proc. ISLPED , pp. 1-6
    • Itoh, K.1
  • 3
    • 0034856732 scopus 로고    scopus 로고
    • Cache decay: Exploiting generational behavior to reduce cache leakage power
    • Jun-Jul
    • S. Kaxiras, Z. Hu, and M. Martonosi, "Cache decay: Exploiting generational behavior to reduce cache leakage power," Proc. of ISCA, pp. 240-251, Jun-Jul 2001.
    • (2001) Proc. of ISCA , pp. 240-251
    • Kaxiras, S.1    Hu, Z.2    Martonosi, M.3
  • 4
    • 0036294454 scopus 로고    scopus 로고
    • Drowsy caches: Simple techniques for reducing leakage power
    • May
    • K. Flautner et al, "Drowsy caches: simple techniques for reducing leakage power," Proc. of ISCA, pp. 148-157, May 2002.
    • (2002) Proc. of ISCA , pp. 148-157
    • Flautner, K.1
  • 6
    • 0023437909 scopus 로고
    • Static-noise margin analysis of MOS SRAM cells
    • Oct.
    • E. Seevinck, F. J. List, and J. Lohstroh, "Static-noise margin analysis of MOS SRAM cells", IEEE J. Solid-State Circuits, vol. SC-22, No. 5, pp. 748-754, Oct. 1987.
    • (1987) IEEE J. Solid-state Circuits , vol.SC-22 , Issue.5 , pp. 748-754
    • Seevinck, E.1    List, F.J.2    Lohstroh, J.3
  • 7
    • 0027850966 scopus 로고
    • Soft error rate and stored charge requirements in advanced high-density SRAMs
    • Dec.
    • C. Lage et al., "Soft error rate and stored charge requirements in advanced high-density SRAMs," Proc. of IEDM, pp. 821-824, Dec. 1993.
    • (1993) Proc. of IEDM , pp. 821-824
    • Lage, C.1
  • 8
    • 84973229963 scopus 로고
    • Steady-state analysis and design of a switched-capacitor DC-DC converter
    • Jun-Jul
    • K.D.T. Ngo and R. Webster, "Steady-state analysis and design of a switched-capacitor DC-DC converter," Proc. of PESC, pp. 378-385, Jun-Jul 1992.
    • (1992) Proc. of PESC , pp. 378-385
    • Ngo, K.D.T.1    Webster, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.