-
2
-
-
84897584809
-
-
L. Bauer, C. Braun, M. E. Imhof, M. A. Kochte, E. Schneider, H. Zhang, J. Henkel, and H.-J. Wunderlich, IEEE Trans. Comput. 62, 1494 (2013)
-
(2013)
IEEE Trans Comput
, vol.62
, pp. 1494
-
-
Bauer, L.1
Braun, C.2
Imhof, M.E.3
Kochte, M.A.4
Schneider, E.5
Zhang, H.6
Henkel, J.7
Wunderlich, H.-J.8
-
3
-
-
77953636772
-
-
E. Pop, Nano Res. 3, 147 (2010)
-
(2010)
Nano Res
, vol.3
, pp. 147
-
-
Pop, E.1
-
4
-
-
84860673822
-
-
Y. Y. Liauw, Z. Zhang, W. Kim, A. E. Gamal, and S. S. Wong, IEEE Int. Conf. Solid-State Circuits Dig. Tech. Pap., 2012, p. 406.
-
(2012)
IEEE Int. Conf. Solid-State Circuits Dig. Tech. Pap
, pp. 406
-
-
Liauw, Y.Y.1
Zhang, Z.2
Kim, W.3
Gamal, A.E.4
Wong, S.S.5
-
5
-
-
79953316838
-
-
M. Iida, M. Koga, K. Inoue, M. Amagasaki, Y. Ichida, M. Saji, J. Iida, and T. Sueyoshi, IEICE Trans. Electron. E94-C, 548 (2011)
-
(2011)
IEICE Trans Electron
, vol.94
, pp. 548
-
-
Iida, M.1
Koga, M.2
Inoue, K.3
Amagasaki, M.4
Ichida, Y.5
Saji, M.6
Iida, J.7
Sueyoshi, T.8
-
6
-
-
84885689141
-
-
M. Miyamura, M. Tada, T. Sakamoto, N. Banno, K. Okamoto, N. Iguchi, and H. Hada, IEDM Tech. Dig., 2012, p. 247.
-
(2012)
IEDM Tech Dig
, pp. 247
-
-
Miyamura, M.1
Tada, M.2
Sakamoto, T.3
Banno, N.4
Okamoto, K.5
Iguchi, N.6
Hada, H.7
-
7
-
-
84860380383
-
-
D. Suzuki, M. Natsui, T. Endoh, H. Ohno, and T. Hanyu, Jpn. J. Appl. Phys. 51, 04DM02 (2012)
-
(2012)
Jpn. J Appl Phys
, vol.51
-
-
Suzuki, D.1
Natsui, M.2
Endoh, T.3
Ohno, H.4
Hanyu, T.5
-
8
-
-
84861723047
-
-
D. Suzuki, M. Natsui, T. Endoh, H. Ohno, and T. Hanyu, J. Appl. Phys. 111, 07E318 (2012)
-
(2012)
J. Appl Phys
, vol.111
-
-
Suzuki, D.1
Natsui, M.2
Endoh, T.3
Ohno, H.4
Hanyu, T.5
-
9
-
-
34247863686
-
-
S. Ikeda, J. Hayakawa, Y. M. Lee, F. Matsukura, Y. Ohno, T. Hanyu, and H. Ohno, IEEE Trans. Electron Devices 54, 991 (2007)
-
(2007)
IEEE Trans Electron Devices
, vol.54
, pp. 991
-
-
Ikeda, S.1
Hayakawa, J.2
Lee, Y.M.3
Matsukura, F.4
Ohno, Y.5
Hanyu, T.6
Ohno, H.7
-
10
-
-
84866526141
-
-
C. Yoshida, T. Ochiai, Y. Iba, Y. Yamazaki, K. Tsunoda, A. Takahashi, and T. Sugii, Symp. VLSI Technology Dig. Tech. Pap., 2012, p. 59.
-
(2012)
Symp. VLSI Technology Dig Tech Pap
, pp. 59
-
-
Yoshida, C.1
Ochiai, T.2
Iba, Y.3
Yamazaki, Y.4
Tsunoda, K.5
Takahashi, A.6
Sugii, T.7
-
11
-
-
51349090249
-
-
S. Matsunaga, J. Hayakawa, S. Ikeda, K. Miura, H. Hasegawa, T. Endoh, H. Ohno, and T. Hanyu, Appl. Phys. Express 1, 091301 (2008)
-
(2008)
Appl. Phys Express
, vol.1
, pp. 091301
-
-
Matsunaga, S.1
Hayakawa, J.2
Ikeda, S.3
Miura, K.4
Hasegawa, H.5
Endoh, T.6
Ohno, H.7
Hanyu, T.8
-
12
-
-
84876532836
-
-
M. Natsui, D. Suzuki, N. Sakimura, R. Nebashi, Y. Tsuji, A. Morioka, T. Sugibayashi, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, and T. Hanyu, IEEE Int. Solid-State Circuits Conf. Dig. Tech. Pap., 2013, p. 194.
-
(2013)
IEEE Int. Solid-State Circuits Conf. Dig. Tech. Pap
, pp. 194
-
-
Natsui, M.1
Suzuki, D.2
Sakimura, N.3
Nebashi, R.4
Tsuji, Y.5
Morioka, A.6
Sugibayashi, T.7
Miura, S.8
Honjo, H.9
Kinoshita, K.10
Ikeda, S.11
Endoh, T.12
Ohno, H.13
Hanyu, T.14
-
13
-
-
82155166226
-
-
C. Augustine, A. Raychowdhury, D. Somasekhar, J. Tschanz, V. De, and K. Roy, IEEE Trans. Electron Devices 58, 4333 (2011)
-
(2011)
IEEE Trans Electron Devices
, vol.58
, pp. 4333
-
-
Augustine, C.1
Raychowdhury, A.2
Somasekhar, D.3
Tschanz, J.4
De, V.5
Roy, K.6
-
14
-
-
80053482045
-
-
W. Zhao, D. Ravelosona, J.-O. Klein, and C. Chappert, IEEE Trans. Magn. 47, 2966 (2011)
-
(2011)
IEEE Trans Magn
, vol.47
, pp. 2966
-
-
Zhao, W.1
Ravelosona, D.2
Klein, J.-O.3
Chappert, C.4
-
15
-
-
84880772201
-
-
S. Fukami, M. Yamanouchi, T. Koyama, K. Ueda, Y. Yoshimura, K.-J. Kim, D. Chiba, H. Honjo, N. Sakimura, R. Nebashi, Y. Kato, Y. Tsuji, A. Morioka, K. Kinoshita, S. Miura, T. Suzuki, H. Tanigawa, S. Ikeda, T. Sugibayashi, N. Kasai, T. Ono, and H. Ohno, Symp. VLSI Technology Dig. Tech. Pap., 2012, p. 230.
-
(2012)
Symp. VLSI Technology Dig Tech Pap
, pp. 230
-
-
Fukami, S.1
Yamanouchi, M.2
Koyama, T.3
Ueda, K.4
Yoshimura, Y.5
Kim, K.-J.6
Chiba, D.7
Honjo, H.8
Sakimura, N.9
Nebashi, R.10
Kato, Y.11
Tsuji, Y.12
Morioka, A.13
Kinoshita, K.14
Miura, S.15
Suzuki, T.16
Tanigawa, H.17
Ikeda, S.18
Sugibayashi, T.19
Kasai, N.20
Ono, T.21
Ohno, H.22
more..
-
16
-
-
84862993875
-
-
S. Fukami, N. Ishiwata, N. Kasai, M. Yamanouchi, H. Sato, S. Ikeda, and H. Ohno, IEEE Trans. Magn. 48, 2152 (2012)
-
(2012)
IEEE Trans Magn
, vol.48
, pp. 2152
-
-
Fukami, S.1
Ishiwata, N.2
Kasai, N.3
Yamanouchi, M.4
Sato, H.5
Ikeda, S.6
Ohno, H.7
-
17
-
-
84883353094
-
-
T. Suzuki, H. Tanigawa, Y. Kobayashi, K. Mori, Y. Ito, Y. Ozaki, K. Suemitsu, T. Kitamura, K. Nagahara, E. Kariyada, N. Ohshima, S. Fukami, M. Yamanouchi, S. Ikeda, M. Hayashi, M. Sakao, and H. Ohno, VLSI Technology Dig. Tech. Pap., 2013, p. 138.
-
(2013)
VLSI Technology Dig. Tech. Pap
, pp. 138
-
-
Suzuki, T.1
Tanigawa, H.2
Kobayashi, Y.3
Mori, K.4
Ito, Y.5
Ozaki, Y.6
Suemitsu, K.7
Kitamura, T.8
Nagahara, K.9
Kariyada, E.10
Ohshima, N.11
Fukami, S.12
Yamanouchi, M.13
Ikeda, S.14
Hayashi, M.15
Sakao, M.16
Ohno, H.17
-
18
-
-
84903303815
-
-
S. Fukami, M. Yamanouchi, S. Ikeda, and H. Ohno, Nat. Commun. 4, 1 (2013)
-
(2013)
Nat. Commun
, vol.4
, pp. 1
-
-
Fukami, S.1
Yamanouchi, M.2
Ikeda, S.3
Ohno, H.4
-
19
-
-
84880816328
-
-
D. Suzuki, Y. Lin, M. Natsui, and T. Hanyu, Jpn. J. Appl. Phys. 52, 04CM04 (2013)
-
(2013)
Jpn. J Appl Phys
, vol.52
-
-
Suzuki, D.1
Lin, Y.2
Natsui, M.3
Hanyu, T.4
-
20
-
-
0003939345
-
-
IEEE Press, Piscataway, NJ
-
A. Chandrakasan, W. J. Bowhill, and F. Fox, Design of High-Performance Mircoprocessor Circuits (IEEE Press, Piscataway, NJ, 2001) p. 128.
-
(2001)
Design of High-Performance Mircoprocessor Circuits
, pp. 128
-
-
Chandrakasan, A.1
Bowhill, W.J.2
Fox, F.3
-
22
-
-
62449267288
-
-
P. M. Braganca, J. A. Katine, N. C. Emley, D. Mauri, J. R. Childress, P. M. Rice, E. Delenia, D. C. Ralph, and R. A. Buhrman, IEEE Trans. Nanotechnol. 8, 190 (2009)
-
(2009)
IEEE Trans. Nanotechnol
, vol.8
, pp. 190
-
-
Braganca, P.M.1
Katine, J.A.2
Emley, N.C.3
Mauri, D.4
Childress, J.R.5
Rice, P.M.6
Delenia, E.7
Ralph, D.C.8
Buhrman, R.A.9
-
23
-
-
69549114650
-
-
J. Z. Sun, M. C. Gaidis, E. J. OSullivan, E. A. Joseph, G. Hu, D. W. Abraham, J. J. Nowak, P. L. Trouilloud, Y. Lu, S. L. Brown, D. C. Worledge, and W. J. Gallagher, Appl. Phys. Lett. 95, 083506 (2009)
-
(2009)
Appl. Phys. Lett
, vol.95
, pp. 083506
-
-
Sun, J.Z.1
Gaidis, M.C.2
Osullivan, E.J.3
Joseph, E.A.4
Hu, G.5
Abraham, D.W.6
Nowak, J.J.7
Trouilloud, P.L.8
Lu, Y.9
Brown, S.L.10
Worledge, D.C.11
Gallagher, W.J.12
-
24
-
-
79955546163
-
-
N. N. Mojumder, S. K. Gupta, S. H. Choday, D. E. Nikonov, and K. Roy, IEEE Trans. Electron Devices 58, 1508 (2011)
-
(2011)
IEEE Trans Electron Devices
, vol.58
, pp. 1508
-
-
Mojumder, N.N.1
Gupta, S.K.2
Choday, S.H.3
Nikonov, D.E.4
Roy, K.5
-
25
-
-
84860436207
-
-
L. Liu, C.-F. Pai, Y. Li, H. W. Tseng, D. C. Ralph, and R. A. Buhrman, Science 336, 555 (2012)
-
(2012)
Science
, vol.336
, pp. 555
-
-
Liu, L.1
Pai, C.-F.2
Li, Y.3
Tseng, H.W.4
Ralph, D.C.5
Buhrman, R.A.6
-
26
-
-
84879088152
-
-
M. Yamanouchi, L. Chen, J. Kim, M. Hayashi, H. Sato, S. Fukami, S. Ikeda, F. Matsukura, and H. Ohno, Appl. Phys. Lett. 102, 212408 (2013)
-
(2013)
Appl. Phys Lett
, vol.102
, pp. 212408
-
-
Yamanouchi, M.1
Chen, L.2
Kim, J.3
Hayashi, M.4
Sato, H.5
Fukami, S.6
Ikeda, S.7
Matsukura, F.8
Ohno, H.9
-
27
-
-
68549087135
-
-
N. Sakimura, T. Sugibayashi, R. Nebashi, and N. Kasai, IEEE J. Solid-State Circuits 44, 2244 (2009)
-
(2009)
IEEE J Solid-State Circuits
, vol.44
, pp. 2244
-
-
Sakimura, N.1
Sugibayashi, T.2
Nebashi, R.3
Kasai, N.4
-
28
-
-
84880803586
-
-
Y. Tsuji, R. Nebashi, N. Sakimura, A. Morioka, H. Honjo, K. Tokutome, S. Miura, T. Suzuki, S. Fukami, K. Kinoshita, T. Hanyu, T. Endoh, N. Kasai, H. Ohno, and T. Sugibayashi, Symp. VLSI Technology Dig. Tech. Pap., 2012, p. 64.
-
(2012)
Symp. VLSI Technology Dig Tech Pap
, pp. 64
-
-
Tsuji, Y.1
Nebashi, R.2
Sakimura, N.3
Morioka, A.4
Honjo, H.5
Tokutome, K.6
Miura, S.7
Suzuki, T.8
Fukami, S.9
Kinoshita, K.10
Hanyu, T.11
Endoh, T.12
Kasai, N.13
Ohno, H.14
Sugibayashi, T.15
-
29
-
-
84866627442
-
-
N. Sakimura, R. Nebashi, Y. Tsuji, H. Honjo, T. Sugibayashi, H. Koike, T. Ohsawa, S. Fukami, T. Hanyu, H. Ohno, and T. Endoh, Proc. IEEE ISCAS, 2012, p. 1971.
-
(2012)
Proc IEEE ISCAS
, pp. 1971
-
-
Sakimura, N.1
Nebashi, R.2
Tsuji, Y.3
Honjo, H.4
Sugibayashi, T.5
Koike, H.6
Ohsawa, T.7
Fukami, S.8
Hanyu, T.9
Ohno, H.10
Endoh, T.11
-
31
-
-
84863946704
-
-
H. Sato, M. Yamanouchi, S. Ikeda, S. Fukami, F. Matsukura, and H. Ohno, Appl. Phys. Lett. 101, 022414 (2012)
-
(2012)
Appl. Phys Lett
, vol.101
, pp. 022414
-
-
Sato, H.1
Yamanouchi, M.2
Ikeda, S.3
Fukami, S.4
Matsukura, F.5
Ohno, H.6
-
32
-
-
51349167171
-
-
S. Ikeda, J. Hayakawa, Y. Ashizawa, Y. M. Lee, K. Miura, H. Hasegawa, M. Tsunoda, F. Matsukura, and H. Ohno, Appl. Phys. Lett. 93, 082508 (2008)
-
(2008)
Appl. Phys Lett
, vol.93
, pp. 082508
-
-
Ikeda, S.1
Hayakawa, J.2
Ashizawa, Y.3
Lee, Y.M.4
Miura, K.5
Hasegawa, H.6
Tsunoda, M.7
Matsukura, F.8
Ohno, H.9
|