Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices

Nano Letters

Volumn 14, Issue 5, 2014, Pages 2401-2406

  Celano, Umberto ^a,b   Goux, Ludovic ^a   Belmonte, Attilio ^a   Opsomer, Karl ^a   Franquet, Alexis ^a   Schulze, Andreas ^a   Detavernier, Christophe ^a,c   Richard, Olivier ^a   Bender, Hugo ^a   Jurczak, Malgorzata ^a   Vandervorst, Wilfried ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c GHENT UNIVERSITY   (Belgium)

Author keywords

AFM tomography; C AFM; CBRAM; Conductive filament; resistive switching

Indexed keywords

ATOMIC FORCE MICROSCOPY; SWITCHING SYSTEMS; TOMOGRAPHY;

AFM-TOMOGRAPHY; C-AFM; CBRAM; CONDUCTIVE FILAMENTS; RESISTIVE SWITCHING;

THREE DIMENSIONAL;

EID: 84900477070     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl500049g     Document Type: Article

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