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Volumn 304, Issue , 2014, Pages 29-34

Growth of thin zirconium and zirconium oxides films on the n-GaN(0 0 0 1) surface studied by XPS and LEED

Author keywords

Gallium nitride; Low energy electron diffraction; Semiconductor insulator interfaces; X ray photoelectron spectroscopy; Zirconium; Zirconium dioxide

Indexed keywords

CHEMICAL BONDS; GALLIUM NITRIDE; III-V SEMICONDUCTORS; LOW ENERGY ELECTRON DIFFRACTION; PHOTOELECTRONS; PHOTONS; WIDE BAND GAP SEMICONDUCTORS; ZIRCONIA; ZIRCONIUM;

EID: 84899973439     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.01.102     Document Type: Conference Paper
Times cited : (11)

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