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Physical Review B - Condensed Matter and Materials Physics

Volumn 89, Issue 11, 2014, Pages

Origins of hole traps in hydrogenated nanocrystalline and amorphous silicon revealed through machine learning

(3) Mueller, Tim a Johlin, Eric b Grossman, Jeffrey C b

a Johns Hopkins University (United States)

b Massachusetts Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84896921383 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.89.115202 Document Type: Article

Times cited : (38)

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