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Volumn 35, Issue 3, 2014, Pages 390-392

Modeling of the hysteretic I-V characteristics of TiO2-based resistive switches using the generalized diode equation

Author keywords

MIM; Resistive switching

Indexed keywords

HYSTERESIS; NANOWIRES; SWITCHES; TITANIUM DIOXIDE;

EID: 84895926376     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2014.2297992     Document Type: Article
Times cited : (18)

References (23)
  • 1
    • 67650102619 scopus 로고    scopus 로고
    • Redox-based resistive switching memories-Nanoionic mechanisms, prospects, and challenges
    • Jul.
    • R. Waser, R. Ditmann, G. Staikov, et al., "Redox-based resistive switching memories-Nanoionic mechanisms, prospects, and challenges," Adv. Mater., vol. 21, nos. 25-26, pp. 2632-2663, Jul. 2009.
    • (2009) Adv. Mater. , vol.21 , Issue.25-26 , pp. 2632-2663
    • Waser, R.1    Ditmann, R.2    Staikov, G.3
  • 2
    • 67649133369 scopus 로고    scopus 로고
    • Mechanism for bipolar switching in a Pt/TiO2/Pt resistive switching cell
    • May
    • D. Jeong, H. Schroeder, and R.Waser, "Mechanism for bipolar switching in a Pt/TiO2/Pt resistive switching cell," Phys. Rev. B, vol. 79, no. 19, pp. 195317-1-195317-10, May 2009.
    • (2009) Phys. Rev. B , vol.79 , Issue.19 , pp. 1953171-19531710
    • Jeong, D.1    Schroeder, H.2    Waser, R.3
  • 3
    • 84864232842 scopus 로고    scopus 로고
    • Oxide-based RRAM: Unified microscopic principle for both unipolar and bipolar switching
    • Dec.
    • B. Gao, J. Kang, Y. Chen, et al., "Oxide-based RRAM: Unified microscopic principle for both unipolar and bipolar switching," in Proc. IEEE IEDM, Dec. 2011, pp. 417-420.
    • (2011) Proc. IEEE IEDM , pp. 417-420
    • Gao, B.1    Kang, J.2    Chen, Y.3
  • 4
    • 84866561026 scopus 로고    scopus 로고
    • Dynamic 'hour glass' model for SET and RESET in HfO2 RRAM
    • Jun.
    • R. Degreave, A. Fantini, S. Clima, et al., "Dynamic 'hour glass' model for SET and RESET in HfO2 RRAM," in Proc. Symp. VLSI Technol., Jun. 2012, pp. 75-76.
    • (2012) Proc. Symp. VLSI Technol , pp. 75-76
    • Degreave, R.1    Fantini, A.2    Clima, S.3
  • 5
    • 70350457460 scopus 로고    scopus 로고
    • SPICE model of memristor with nonlinear dopant drift
    • Z. Biolek, D. Biolek, and V. Biolkova, "SPICE model of memristor with nonlinear dopant drift," Radioengineering, vol. 18, no. 2, pp. 210-214, 2009.
    • (2009) Radioengineering , vol.18 , Issue.2 , pp. 210-214
    • Biolek, Z.1    Biolek, D.2    Biolkova, V.3
  • 6
    • 82155166369 scopus 로고    scopus 로고
    • Modeling the universal set/reset characteristics of bipolar RRAM by field-and temperature-driven filament growth
    • Dec.
    • D. Ielmini, "Modeling the universal set/reset characteristics of bipolar RRAM by field-and temperature-driven filament growth," IEEE Trans. Electron Devices, vol. 58, no. 12, pp. 4309-4317, Dec. 2011.
    • (2011) IEEE Trans. Electron Devices , vol.58 , Issue.12 , pp. 4309-4317
    • Ielmini, D.1
  • 7
    • 84855921198 scopus 로고    scopus 로고
    • Simulation of multilevel switching in electrochemical metallization memory cells
    • Jan.
    • S. Menzel, U. Bottger, and R. Waser, "Simulation of multilevel switching in electrochemical metallization memory cells," J. Appl. Phys., vol. 111, no. 1, pp. 014501-1-014501-5, Jan. 2012.
    • (2012) J. Appl. Phys. , vol.111 , Issue.1 , pp. 0145011-0145015
    • Menzel, S.1    Bottger, U.2    Waser, R.3
  • 8
    • 84866886745 scopus 로고    scopus 로고
    • A SPICE compact model of metal oxide resistive switching memory with variations
    • Oct.
    • X. Guan, S. Yu, and H.-S. P. Wong, "A SPICE compact model of metal oxide resistive switching memory with variations," IEEE Electron Device Lett., vol. 33, no. 10, pp. 1405-1407, Oct. 2012.
    • (2012) IEEE Electron Device Lett. , vol.33 , Issue.10 , pp. 1405-1407
    • Guan, X.1    Yu, S.2    Wong, H.-S.P.3
  • 9
    • 84861720646 scopus 로고    scopus 로고
    • Analysis and modeling of resistive switching statistics
    • Apr.
    • S. Long, C. Cagli, D. Ielmini, et al., "Analysis and modeling of resistive switching statistics," J. Appl. Phys., vol. 111, no. 7, pp. 074508-1-074508-19, Apr. 2012.
    • (2012) J. Appl. Phys. , vol.111 , Issue.7 , pp. 0745081-07450819
    • Long, S.1    Cagli, C.2    Ielmini, D.3
  • 10
    • 73849125847 scopus 로고    scopus 로고
    • Electrical transport and thermometry of electroformed titanium dioxide memristive switches
    • Dec.
    • J. Borgetti, D. B. Strukov, M. D. Pickett, et al., "Electrical transport and thermometry of electroformed titanium dioxide memristive switches," J. Appl. Phys., vol. 106, no. 12, pp. 124504-1-124504-5, Dec. 2009.
    • (2009) J. Appl. Phys. , vol.106 , Issue.12 , pp. 1245041-1245045
    • Borgetti, J.1    Strukov, D.B.2    Pickett, M.D.3
  • 11
    • 79959342174 scopus 로고    scopus 로고
    • Feedback write scheme for memristive switching devices
    • Mar.
    • W. Yi, F. Perner, M. Qureshi, et al., "Feedback write scheme for memristive switching devices," Appl. Phys. A, vol. 102, no. 4, pp. 973-982, Mar. 2011.
    • (2011) Appl. Phys. A , vol.102 , Issue.4 , pp. 973-982
    • Yi, W.1    Perner, F.2    Qureshi, M.3
  • 12
    • 78149260996 scopus 로고    scopus 로고
    • Modeling for bipolar resistive memory switching in transition-metal oxides
    • Oct.
    • J. Hur, M. Lee, C. Lee, et al., "Modeling for bipolar resistive memory switching in transition-metal oxides," Phys. Rev. B, vol. 82, no. 15, pp. 155321-1-155321-5, Oct. 2010.
    • (2010) Phys. Rev. B , vol.82 , Issue.15 , pp. 1553211-1553215
    • Hur, J.1    Lee, M.2    Lee, C.3
  • 13
    • 77953023010 scopus 로고    scopus 로고
    • Model for the resistive switching effect in HfO2 MIM structures based on the transmission properties of narrow constrictions
    • Jun.
    • E. Miranda, C. Walczyk, C. Wenger, et al., "Model for the resistive switching effect in HfO2 MIM structures based on the transmission properties of narrow constrictions," IEEE Electron Device Lett., vol. 31, no. 6, pp. 609-611, Jun. 2010.
    • (2010) IEEE Electron Device Lett. , vol.31 , Issue.6 , pp. 609-611
    • Miranda, E.1    Walczyk, C.2    Wenger, C.3
  • 14
    • 79956090576 scopus 로고    scopus 로고
    • Scaling limits of resistive memories
    • Jun.
    • V. Zhirnov, R. Meade, R. K. Cavin, et al., "Scaling limits of resistive memories," Nanotechnology, vol. 22, no. 25, pp. 254027-254048, Jun. 2011.
    • (2011) Nanotechnology , vol.22 , Issue.25 , pp. 254027-254048
    • Zhirnov, V.1    Meade, R.2    Cavin, R.K.3
  • 15
    • 33645641019 scopus 로고    scopus 로고
    • Switching the electrical resistance of individual dislocations in single-crystalline SrTiO3
    • Mar.
    • K. Szot, W. Speier, G. Bihlmayer, et al., "Switching the electrical resistance of individual dislocations in single-crystalline SrTiO3, Nature Mater., vol. 5, pp. 312-320, Mar. 2006.
    • (2006) Nature Mater. , vol.5 , pp. 312-320
    • Szot, K.1    Speier, W.2    Bihlmayer, G.3
  • 16
    • 0034290965 scopus 로고    scopus 로고
    • Exact analytical solutions of the forward non-ideal diode equation with series and shunt parasitic resistances
    • DOI 10.1016/S0038-1101(00)00132-5
    • A. Ortiz-Conde, F. Garcia-Sánchez, and J. Muci, "Exact analytical solutions of forward non-ideal diode equation with series and shunt parasitic resistances," Solid-State Electron., vol. 44, no. 10, pp. 1861-1864, Jan. 2000. (Pubitemid 32035106)
    • (2000) Solid-State Electronics , vol.44 , Issue.10 , pp. 1861-1864
    • Ortiz-Conde, A.1    Garcia Sanchez, F.J.2    Muci, J.3
  • 17
    • 84885163082 scopus 로고    scopus 로고
    • A compact model for binary oxides-based memristive interfaces
    • Oct.
    • N. Ghenzi, M. Sánchez, and P. Levy, "A compact model for binary oxides-based memristive interfaces," J. Phys. D, Appl. Phys., vol. 46, no. 41, pp. 415101-1-415101-3, Oct. 2013.
    • (2013) J. Phys. D, Appl. Phys. , vol.46 , Issue.41 , pp. 4151011-4151013
    • Ghenzi, N.1    Sánchez, M.2    Levy, P.3
  • 18
    • 0037158578 scopus 로고    scopus 로고
    • Heating in current carrying molecular junctions
    • DOI 10.1063/1.1495845
    • D. Segal and A. Nitzan, "Heating in current carrying molecular junctions," J. Chem. Phys., vol. 117, pp. 3915-3927, Aug. 2002. (Pubitemid 35000310)
    • (2002) Journal of Chemical Physics , vol.117 , Issue.8 , pp. 3915-3927
    • Segal, D.1    Nitzan, A.2
  • 20
    • 84866900482 scopus 로고    scopus 로고
    • The quantum point-contact memristor
    • Oct.
    • E. Miranda, D. Jiménez, and J. Suñé, "The quantum point-contact memristor," IEEE Electron Device Lett., vol. 33, no. 10, pp. 1474-1476, Oct. 2012.
    • (2012) IEEE Electron Device Lett. , vol.33 , Issue.10 , pp. 1474-1476
    • Miranda, E.1    Jiménez, D.2    Suñé, J.3
  • 21
    • 0002878283 scopus 로고
    • New conduction and reversible memory phenomena in thin insulating films
    • Oct.
    • J. Simmons and R. Verderber, "New conduction and reversible memory phenomena in thin insulating films," Proc. R. Soc. London Ser. A, Math. Phys. Sci., vol. 301, no. 1464, pp. 77-102, Oct. 1967.
    • (1967) Proc. R. Soc. London Ser. A, Math. Phys. Sci. , vol.301 , Issue.1464 , pp. 77-102
    • Simmons, J.1    Verderber, R.2
  • 22
    • 0035883782 scopus 로고    scopus 로고
    • Electrical current distribution across a metal-insulator-metal structure during bistable switching
    • DOI 10.1063/1.1389522
    • C. Rossel, G. I. Meijer, D. Bremaud, et al., "Electrical current distribution across a metal-insulator-metal structure during bistable switching," J. Appl. Phys., vol. 90, no. 6, pp. 2892-2898, Sep. 2001. (Pubitemid 33600737)
    • (2001) Journal of Applied Physics , vol.90 , Issue.6 , pp. 2892-2898
    • Rossel, C.1    Meijer, G.I.2    Bremaud, D.3    Widmer, D.4
  • 23
    • 77957907723 scopus 로고    scopus 로고
    • Towards a quantitative description of solid electrolyte conductance switches
    • Aug.
    • M. Morales-Masis, H.-D. Wiemhofer, and J. M. van Ruitenbeek, "Towards a quantitative description of solid electrolyte conductance switches," Nanoscale, vol. 2, no. 10, pp. 2275-2280, Aug. 2010.
    • (2010) Nanoscale , vol.2 , Issue.10 , pp. 2275-2280
    • Morales-Masis, M.1    Wiemhofer, H.-D.2    Van Ruitenbeek, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.