Noise spectroscopy of resistive components at elevated temperature

Metrology and Measurement Systems

Volumn 21, Issue 1, 2014, Pages 15-26

  Stadler, Adam Witold ^a   Zawiślak, Zbigniew ^a   Dziedzic, Andrzej ^b   Nowak, Damian ^b  

^a RZESZOW UNIVERSITY OF TECHNOLOGY   (Poland)

^b WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Low frequency noise; Low frequency noise measurement; Noise spectroscopy; Resistance noise; Thick film resistors

Indexed keywords

EID: 84894075971     PISSN: 08608229     EISSN: None     Source Type: Journal    
DOI: 10.2478/mms-2014-0002     Document Type: Article

References (35)

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