Noise and switching phenomena in thick-film resistors

Journal of Physics D: Applied Physics

Volumn 41, Issue 2, 2008, Pages

  Kolek, A ^a   Stadler, A W ^a   Zawislak Z ^a   Mleczko, K ^a   Dziedzic, A ^b  

^a RZESZOW UNIVERSITY OF TECHNOLOGY   (Poland)

^b WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; GRAIN BOUNDARIES; RESISTORS; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

LOW FREQUENCY NOISE; NOISE SPECTROSCOPY; RESISTIVE FILMS; THICK FILM RESISTORS;

THICK FILM CIRCUITS;

EID: 38049087518     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/2/025303     Document Type: Article

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