A Method of RTS Noise Identification in Noise Signals of Semiconductor Devices in the Time Domain

Metrology and Measurement Systems

Volumn 17, Issue 1, 2010, Pages 95-107

  Stawarz Graczyk, Barbara ^a   Dokupil, Dariusz ^a   Flisikowski, Paweł ^a  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Gram Charlier series; optocouplers; RTS noise; semiconductor devices

Indexed keywords

EID: 84986251152     PISSN: 08608229     EISSN: None     Source Type: Journal    
DOI: 10.2478/v10178-010-0010-z     Document Type: Article

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