Estimation errors in 1/fγ noise spectra when employing DFT spectrum analyzers

Fluctuation and Noise Letters

Volumn 12, Issue 1, 2013, Pages

  Giusi, G ^a   Scandurra, G ^a   Ciofi, C ^a  

^a Chimica e Ingegneria Industriale   (Italy)

Author keywords

1 f noise; Discrete Fourier Transform; Flicker noise; low frequency noise measurements; spectrum estimation

Indexed keywords

EID: 84876274413     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219477513500077     Document Type: Article

References (27)

1. M. Keshner, 1/f noise, Proc. IEEE 70 (1982) 212-218.
2. J. B. Johnson, The Schottky effect in low frequency circuits, Physic. Rev. 26 (1925) 71-85.
3. A. L. McWhorter, 1/f noise and related surface effects in germanium, R.L.E. 295 and Lincoln Lab Tech Report. 80, M.I.T. (1955).
4. B. B. Mandelbrot and I.W. Van Ness, Fractional brownian motions, fractional noises, and applications, SIAM Rev. 10(4) (1968) 422-437.
5. V. Paxson, Fast approximation of self-similar network traffic, Tech. Report LBL-36750, Lawrence Berkeley Lab. (Apr. 1995).
6. T. Lundahl, W. Ohley, S. Kay and R. Siffert, Fractional Brownian motion: A maximum likelihood estimator and its application to image texture, IEEE Trans. Med. Imag. MI-5 (1986) 152-161.
7. M. J. Campbell and B. W. Jones, Cyclic changes in the insulin needs of an unstable diabetic, Science 177 (1972) 889-891.
8. A. L. Goldberger and B. West, Fractals in physiology and medicine, Yale J. Med. Biol. 60 (1987) 421-435.
9. F. N. Hooge and A. M. Hoppenbrouwers, 1/f noise in continuous thin gold films, Physica 45 (1969) 386-392.
10. L. K. J. Vandamme, On the origin of 1/f noise in MOSFETs, Fluct. Noise Lett. 7(3) (2007) 321-339.
11. P. Bruschi, A. Nannini and B. Neri, Vapour and gas sensing by noise measurement on polymeric balanced bridge microstructures, Sensors Actuat. B 25 (1995) 429.
12. G. Schmera and L. B. Kish, Fluctuation-enhanced gas sensing by surface acoustic wave devices, Fluct. Noise Lett. 2 (2002) L117-L123.
13. P. D. Welch, The use of fast Fourier transform for the estimation of power spectra: A method based on time averaging over short, modified periodograms, IEEE Trans. Audio Electroac. AU-15 (1967) 70-73.
14. M. Deriche and A. Tewfik, Maximum likelihood estimation of the parameters of discrete fractionally differenced Gaussian noise process, IEEE Trans. Signal Process. 41 (1993) 2977-2989.
15. J.-S. Leu and A. Papamarcou, On estimating the spectral exponent of fractional Brownian motion, IEEE Trans. Inform. Theory 41 (1995) 233-244.
16. G.Wornell and A. Oppenheim, Estimation of fractal signals from noise measurements using wavelets, IEEE Trans. Signal Process. 40 (1992) 611-623.
17. P. Abry, P. Goncalves and P. Flandrin, Wavelets, spectrum analysis and 1/f processes, in Lecture Notes in Statistics: Wavelets and Statistics, Vol. 103, eds. A. Antoniadis and G. Oppenheim (Springer, New York, 1995), pp. 15-29.
18. B. Ninness, Estimation of 1/f noise, IEEE Trans. Inform. Theo. 44(1) (1998) 32-46.
19. D. W. Allan and J. A. Barnes, A modified Allan variance with increased oscillator characterization ability, in Proc. 35th Annual Freq. Contr. Symp. (1981).
20. E. Masry, Flicker noise and the estimation of the Allan variance, IEEE Trans. Inform. Theo. 37(4) (1991) 1173-1177.
21. J. Lee and G. Bosman, 1/f Drain current noise model in ultrathin oxide mosfets, Fluct. Noise Lett. 4 (2004) L297-L307.
22. J. W. Wozencraft and I. M. Jacobs, Principles of Communication Engineering, Ch. 4.3 (Wiley, New York, 1965), pp. 223-228.
23. P. P. Vaidyanathan, Multirate systems and filter banks, in Signal Processing Series (Prentice-Hall, Englewood Cliffs, NJ, 1992).
24. F. J. Harris, On the use of windows for harmonic analysis with the discrete Fourier transform, in Proc. IEEE 66(1) (1978) 51-83.
25. T. G. M. Kleinpenning and A. H. de Kuijper, Relation between variance and sample duration of 1/f noise signals, J. Appl. Phys. 63 (1988) 43-45.
26. G. Cannata, G. Scandurra and C. Ciofi, An ultralow noise preamplifier for low frequency noise measurements, Rev. Sci. Instr. 80 (2009) 114702.
27. D. Maji, F. Crupi, G. Giusi, C. Pace, E. Simoen, C. Claeys and R. Rao, On the DC and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2Gate Stack, Appl. Physic. Lett. 92 (2008) 163508.