Noise properties of thick-film resistors in extended temperature range

Microelectronics Reliability

Volumn 51, Issue 7, 2011, Pages 1264-1270

  Stadler, Adam Witold ^a  

^a RZESZOW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; ALUMINA SUBSTRATES; CONDUCTIVE PASTES; CROSS CORRELATION TECHNIQUES; EXPERIMENTAL STUDIES; LORENTZIAN NOISE; LOW NOISE; LOW-FREQUENCY NOISE; MATERIALS SYSTEMS; MULTI TERMINALS; NOISE COMPONENTS; NOISE INTENSITIES; NOISE MEASUREMENTS; NOISE PROPERTIES; NOISE SOURCE; NOISE SPECTRA; PERFORMANCE PARAMETERS; TEMPERATURE RANGE; THERMALLY ACTIVATED; THICK FILM RESISTORS; THICK-FILM TECHNOLOGY;

LEAD; RESISTORS; RUTHENIUM ALLOYS; RUTHENIUM COMPOUNDS; SILVER;

ELECTRIC PROPERTIES;

EID: 79958141471     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.02.023     Document Type: Conference Paper

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