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Volumn 152, Issue 5, 2013, Pages 164-168

Development of noise measurements. part 3. Passive method of electronic elements quality characterization

Author keywords

Electrical noise power; Electronic element; Relaxation constant

Indexed keywords

SENSORS; TRANSDUCERS;

EID: 84880356719     PISSN: None     EISSN: 17265479     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (7)
  • 1
    • 84863640145 scopus 로고    scopus 로고
    • Accuracy and metrological reliability enhancing of thermoelectric transducers
    • December
    • B. Stadnyk, S. Yatsyshyn, Accuracy and metrological reliability enhancing of thermoelectric transducers, Sensors & Transducers, Vol. 123, Issue 12, December 2010, pp. 69-79.
    • (2010) Sensors & Transducers , vol.123 , Issue.12 , pp. 69-79
    • Stadnyk, B.1    Yatsyshyn, S.2
  • 2
    • 84880350159 scopus 로고    scopus 로고
    • Problems and Concepts of Ensuring Reliability of Electro-and Radio-Electronic Apparatus
    • Yu. Bobalo, Problems and Concepts of Ensuring Reliability of Electro-and Radio-Electronic Apparatus, Computational Problems of Electrical Engineering, Vol. 1, Issue 1, 2011, pp. 1-3.
    • (2011) Computational Problems of Electrical Engineering , vol.1 , Issue.1 , pp. 1-3
    • Bobalo, Y.1
  • 3
    • 84880372413 scopus 로고    scopus 로고
    • Low-frequency noises of electron components as tool for diagnosing inner defects
    • (in Russian)
    • D. Razumenko, Low-frequency noises of electron components as tool for diagnosing inner defects, Components and Technologies, Issue 9, 2008, pp. 168-174 (in Russian).
    • (2008) Components and Technologies , Issue.9 , pp. 168-174
    • Razumenko, D.1
  • 4
    • 0001268869 scopus 로고
    • Flicker (1/f) noise: Equilibrium temperature end resistance fluctuations
    • R. F. Voss, J. Clarke, Flicker (1/f) noise: equilibrium temperature end resistance fluctuations, Phys. Rev., Ser. B., Vol. 13, Issue 2, 1976, pp. 556-573.
    • (1976) Phys. Rev. Ser. B. , vol.13 , Issue.2 , pp. 556-573
    • Voss, R.F.1    Clarke, J.2
  • 5
    • 21144450038 scopus 로고    scopus 로고
    • Nonequilibrium 1/fγ noise in conducting films and contacts
    • (in Russian)
    • G. P. Zhigalskiy, Nonequilibrium 1/fγ noise in conducting films and contacts, Suc. Phys. Sci., Vol. 46, 2003, pp. 449-471 (in Russian).
    • (2003) Suc. Phys. Sci. , vol.46 , pp. 449-471
    • Zhigalskiy, G.P.1
  • 6
    • 78149367095 scopus 로고    scopus 로고
    • Flicker-noise of electronic equipment: Sources, ways of reduction and application
    • Z. A. Kolodiy, Flicker-noise of electronic equipment: Sources, ways of reduction and application, Radioelectronics & Com. Systems, Vol. 53, Issue 8, 2010, pp. 412-417.
    • (2010) Radioelectronics & Com. Systems , vol.53 , Issue.8 , pp. 412-417
    • Kolodiy, Z.A.1
  • 7
    • 54749120128 scopus 로고    scopus 로고
    • Detection of changes in the structure of a system according to changes of its flicker noise
    • (in Ukrainian)
    • Z. A. Kolodiy, Detection of changes in the structure of a system according to changes of its flicker noise, Ukr. J. Phys, Vol. 53, Issue 7, 2008., pp. 718-722 (in Ukrainian).
    • (2008) Ukr. J. Phys , vol.53 , Issue.7 , pp. 718-722
    • Kolodiy, Z.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.