Electrochromic foil-based devices: Optical transmittance and modulation range, effect of ultraviolet irradiation, and quality assessment by 1/f current noise

Thin Solid Films

Volumn 516, Issue 17, 2008, Pages 5921-5926

  Granqvist, C G ^a   Green, S ^a   Jonson, E K ^a   Marsal, R ^a   Niklasson, G A ^a   Roos, A ^a   Topalian, Z ^a   Azens, A ^b   Georen P ^b   Gustavsson, G ^b   Karmhag, R ^b   Smulko, J ^c   Kish, L B ^d  

^a UPPSALA UNIVERSITY   (Sweden)

^b ChromoGenics Sweden AB   (Sweden)

^c GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

^d Department of Electrical and Computer Engineering   (United States)

Author keywords

Electrochromism; Nickel oxide; Noise spectroscopy; Optical properties; Smart window; Sputtering; Thin film; Tungsten oxide

Indexed keywords

ACOUSTIC SPECTROSCOPY; ELECTROCHROMISM; NICKEL OXIDE; OPACITY; SOLAR RADIATION; SPUTTERING; TUNGSTEN COMPOUNDS;

DIP COATING; ELECTROMAGNETIC NOISE SPECTROSCOPY; SMART WINDOW; TUNGSTEN OXIDE;

THIN FILMS;

EID: 44249123543     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.10.074     Document Type: Article

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