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Volumn 63, Issue 1, 2014, Pages 201-213

Size-dependence of the dielectric breakdown strength from nano- to millimeter scale

Author keywords

Ceramics; Dielectric breakdown strength; Dielectric breakdown toughness; Polymers; Size dependence

Indexed keywords

BREAKDOWN STRENGTHS; CERAMICS; CHARACTERISTIC LENGTH; CONDUCTING FILAMENT; DIELECTRIC BREAKDOWN STRENGTH; ELECTRONIC DEVICE; POLYMER MATERIALS; SIZE-DEPENDENCE;

EID: 84891832930     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmps.2013.09.009     Document Type: Article
Times cited : (176)

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