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Journal of Materials Science

Volumn 45, Issue 24, 2010, Pages 6685-6693

Effects of sintering temperature on the microstructure and dielectric properties of titanium dioxide ceramics

(3) Chao, Sheng a Petrovsky, Vladimir a Dogan, Fatih a

a Architectural and Environmental Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

D.C. CONDUCTIVITY; DEFECT CHEMISTRY; DIELECTRIC BREAKDOWN STRENGTH; DIELECTRIC CONSTANTS; ELECTRICAL CONDUCTIVITY; GRAIN SIZE; HIGH DIELECTRIC CONSTANTS; HIGH ENERGY DENSITY CAPACITORS; LOSS TANGENT; LOW LOSS; MICROSTRUCTURAL DEVELOPMENT; NANO-STRUCTURED; NANOSTRUCTURED TIO; PRESSURELESS SINTERING; PURE OXYGEN; SEM; SINTERED SAMPLES; SINTERING DENSITY; SINTERING TEMPERATURES; TIO;

ATMOSPHERIC TEMPERATURE; CERAMIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; OXIDES; OXYGEN; PERMITTIVITY; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; TITANIUM; TITANIUM DIOXIDE; X RAY DIFFRACTION;

SINTERING;

EID: 78149466101 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-010-4761-4 Document Type: Article

Times cited : (35)

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