Electrical fracture toughness for conductive cracks driven by electric fields in piezoelectric materials

Applied Physics Letters

Volumn 76, Issue 1, 2000, Pages 126-128

  Fu, Ran ^a   Qian, Cai Fu ^a   Zhang, Tong Yi ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012652395     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125678     Document Type: Article

References (14)

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