Proposed universal relationship between dielectric breakdown and dielectric constant

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2002, Pages 633-636

  McPherson, J ^a   Kim, J ^a   Shanware, A ^a   Mogul, H ^a   Rodriguez, J ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CURRENT DENSITY; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; ENERGY GAP; ENTHALPY; GATES (TRANSISTOR); PERMITTIVITY; SILICA;

DIELECTRIC BREAKDOWN;

DIELECTRIC MATERIALS;

EID: 0036923577     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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