Dielectric breakdown of alumina single crystals

Journal of the European Ceramic Society

Volumn 32, Issue 5, 2012, Pages 1053-1057

  Neusel, C ^a   Jelitto, H ^a   Schmidt, D ^a   Janssen, R ^a   Felten, F ^b   Schneider, G A ^a  

^a HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

^b ROBERT BOSCH GMBH   (Germany)

Author keywords

Dielectric properties; Failure analysis; Insulators; Optical microscopy; Single crystal Al 2O 3

Indexed keywords

A-PLANE; BREAKDOWN CHANNEL; BREAKDOWN STRENGTHS; CRYSTAL SURFACES; OBLIQUE DIRECTION; SINGLE CRYSTAL SAMPLES; SINGLE-CRYSTAL AL 2O 3;

ALUMINA; CRYSTAL ORIENTATION; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRIC INSULATORS; FAILURE ANALYSIS; LEAKAGE CURRENTS; OPTICAL MICROSCOPY;

SINGLE CRYSTALS;

EID: 84855795117     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2011.11.013     Document Type: Article

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