Dependence of breakdown field on dielectric (interelectrode) thickness in base-metal electroded multilayer capacitors

Applied Physics Letters

Volumn 90, Issue 11, 2007, Pages

  Milliken, Alexander D ^a,b   Bell, Andrew J ^b   Scott, James F ^c  

^a AVX Limited   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRODES; FIELD EMISSION; IONIZATION; MULTILAYERS;

BASE-METAL ELECTRODES; COLLISION IONIZATION; ELECTRODE SEPARATION; MULTILAYER CAPACITORS;

CAPACITORS;

EID: 33947313683     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2713780     Document Type: Article

References (8)

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