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Volumn 29, Issue 3, 2004, Pages
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Three-Dimensional Coherent X-Ray Diffraction Microscopy
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Author keywords
Microscopy; Nanocrystal shapes; Strain; Three dimensional coherent x ray diffraction
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Indexed keywords
CARRIER CONCENTRATION;
COMPUTER SIMULATION;
CRYSTALLINE MATERIALS;
GRAIN BOUNDARIES;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
STRAIN;
X RAY DIFFRACTION ANALYSIS;
NANOCRYSTAL SHAPES;
THREE-DIMENSIONAL COHERENT X-RAY DIFFRACTION;
X RAY OPTICS;
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EID: 1642619520
PISSN: 08837694
EISSN: None
Source Type: Journal
DOI: 10.1557/mrs2004.56 Document Type: Article |
Times cited : (39)
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References (22)
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