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Volumn 29, Issue 3, 2004, Pages

Three-Dimensional Coherent X-Ray Diffraction Microscopy

Author keywords

Microscopy; Nanocrystal shapes; Strain; Three dimensional coherent x ray diffraction

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; STRAIN; X RAY DIFFRACTION ANALYSIS;

EID: 1642619520     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2004.56     Document Type: Article
Times cited : (39)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.