Spot size characterization of focused non-Gaussian X-ray laser beams

Optics Express

Volumn 18, Issue 26, 2010, Pages 27836-27845

  Chalupsky J ^a,b   Krzywinski, J ^c   Juha, L ^a   Hajkova V ^a   Cihelka, J ^a   Burian, T ^a   Vysin L ^a   Gaudin, J ^d   Gleeson, A ^e   Jurek, M ^f   Khorsand, A R ^g   Klinger, D ^a   Wabnitz, H ⁱ   Sobierajski, R ^f,h   Stormer M ^j   Tiedtke, K ⁱ   Toleikis, S ⁱ  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d EUROPEAN XFEL GMBH   (Germany)

^e DARESBURY LABORATORY   (United Kingdom)

^f INSTITUTE OF PHYSICS   (Poland)

^g RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^h FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

ⁱ DESY   (Germany)

^j INSTITUTE OF MATERIALS RESEARCH   (Germany)

more..

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS CARBON; ESTERS; FREE ELECTRON LASERS; GAUSSIAN DISTRIBUTION; GAUSSIAN NOISE (ELECTRONIC); LASER BEAMS; X RAY LASERS;

AMORPHOUS CARBON (A-C); ANALYTICAL FORMULAS; BEAM SPOT; EFFECTIVE AREA; FEMTOSECONDS; NON-GAUSSIAN; SCAN METHODS; SOFT X-RAY; SPATIAL BEAMS; SPOT SIZES; X-RAY LASER BEAMS;

GAUSSIAN BEAMS;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; LASER; LIGHT; NORMAL DISTRIBUTION; RADIATION SCATTERING; STATISTICAL MODEL; X RAY;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LASERS; LIGHT; MODELS, STATISTICAL; NORMAL DISTRIBUTION; SCATTERING, RADIATION; X-RAYS;

EID: 78650567297     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.027836     Document Type: Article

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