Restriction on the gain in collected charge due to carrier avalanche multiplication in heavily irradiated Si strip detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 730, Issue , 2013, Pages 66-72

  Verbitskaya, E ^a   Eremin, V ^a   Zabrodskii, A ^a   Li, Z ^b   Luukka, P ^c  

^a IOFFE INSTITUTE   (Russian Federation)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c HELSINKI INSTITUTE OF PHYSICS   (Finland)

Author keywords

Avalanche multiplication; Charge collection; Electric field distribution; Radiation hardness; Silicon detector

Indexed keywords

AVALANCHE MULTIPLICATION; AVALANCHE MULTIPLICATION EFFECTS; CHARGE COLLECTION; ELECTRIC FIELD DISTRIBUTIONS; RADIATION HARDNESS; RADIATION INDUCED DEFECTS; RADIATION PERFORMANCE; SPACE CHARGE LIMITED CURRENTS;

CARRIER CONCENTRATION; DETECTORS; ELECTRIC FIELDS; SILICON;

SILICON DETECTORS;

EID: 84888325387     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2013.06.086     Document Type: Article

References (27)

1. 〈www.cern.ch/rd50âŒ
2. I. Mandić, V. Cindro, G. Kramberger, and M. Mikuž Nuclear Instruments and Methods A 603 2009 263
3. I. Mandić, A. Gorišek, G. Kramberger, and M. Zavrtanik Nuclear Instruments and Methods A 612 2010 474
4. M. Mikuž, V. Cindro, G. Kramberger, I. Mandić, and M. Zavrtanik Nuclear Instruments and Methods A 636 2011 550
5. A. Affolder, P.P. Allport, and G. Casse Nuclear Instruments and Methods A 612 2010 470
6. A. Dierlamm Nuclear Instruments and Methods A 624 2010 395
7. G. Casse, A. Affolder, P.P. Allport, H. Brown, I. McLeod, and M. Wormald Nuclear Instruments and Methods A 636 2011 556
8. J. Lange, J. Becker, E. Fretwurst, R. Klanner, and G. Lindström Nuclear Instruments and Methods A 622 2010 49
9. J. Lange, J. Becker, D. Eckstein, E. Fretwurst, R. Klanner, and G. Lindström Nuclear Instruments and Methods A 624 2010 405
10. A. Affolder Nuclear Instruments and Methods A 658 2011 11
11. M. Köhler Nuclear Instruments and Methods A 659 2011 272
12. G. Kramberger, V. Cindro, I. Mandić, M. Mikuž, M. Milovanović, M. Zavrtanik, Charge collection studies on heavily irradiated diodes from RD50 multiplication run (update), presented at 20 RD50 Collaboration Workshop, May 30-June 1, Bari. Available from: 〈www.cern.ch/rd50âŒ, 2012.
13. G. Kramberger, V. Cindro, I. Mandić, M. Mikuž, M. Milovanović, M. Zavrtanik, Charge collection studies on heavily irradiated diodes from RD50 multiplication run (update), presented at 21 RD50 Collaboration Workshop, Geneva, CERN, November 14-16. Available from: 〈www.cern.ch/rd50âŒ, 2012.
14. G. Casse, Recent developments in silicon detectors, in: Proceedings of the 13th Vienna Conference on Instrumentation, Vienna, February 11-15. Available from: 〈http://vci.hephy.atâŒ, 2013.
15. E. Verbitskaya, V. Eremin, A. Zabrodskii, Z. Li, and J. Härkönen Nuclear Instruments and Methods A 624 2010 419
16. V. Eremin, E. Verbitskaya, Z. Li, J. Härkönen, The avalanche effect in operation of heavily irradiated Si p-i-n detectors, presented at 14 RD50 Collaboration Workshop, Freiburg, June 3-5. Available from: 〈www.cern.ch/rd50âŒ, 2009.
17. V. Eremin, E. Verbitskaya, A. Zabrodskii, Z. Li, and J. Härkönen Nuclear Instruments and Methods A 658 2011 145
18. E. Verbitskaya, V. Eremin, A. Zabrodskii, Journal of Instrumentation, v.7, 2 ArtNo: #C02061, doi:10.1088/1748-0221/7/02/C02061, 2012.
19. Hamamatsu Photonics, Catalog, 〈http://www.hamamatsu. suâŒ.
20. M. Lampert, and P. Mark Current Injection in Solids 1970 Academic Press London, NY
21. E. Verbitskaya, V. Eremin, Z. Li, J. Härkönen, and M. Bruzzi Nuclear Instruments and Methods A 583 2007 77
22. G. Lindström, M. Moll, and E. Fretwurst Nuclear Instruments and Methods A 426 1999 1
23. E. Verbitskaya, Temperature dependence of reverse current of irradiated Si detectors, presented at 20 RD50 Collaboration Workshop, Bari, May 31-June 2. Available from: 〈www.cern.ch/rd50âŒ, 2012.
24. V. Eremin, Z. Li, S. Roe, G. Ruggiero, and E. Verbitskaya Nuclear Instruments and Methods A 535 2004 622
25. S.M. Sze Physics of Semiconductor Devices 2nd Edition 1981 J. Wiley & Sons
26. B.J. Baliga Modern Power Devices 1987 Wiley Hoboken, NJ
27. G. Casse, P. Dervan, D. Forshaw, A. Greenall, I. Tsurin, T. Huse, Update on thin vs thick micro-strip detector studies, presented at 20 RD50 Collaboration Workshop, Bari, May 31-June 2. Available from: 〈www.cern.ch/rd50âŒ, 2012.