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Volumn 612, Issue 3, 2010, Pages 474-477
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Observation of full charge collection efficiency in heavily irradiated n+p strip detectors irradiated up to 3×1015 neq/cm2
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Author keywords
Microstrip detectors; P type silicon; Radiation Hardness; Super LHC
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Indexed keywords
BULK SILICON;
CHARGE COLLECTION;
CHARGE COLLECTION EFFICIENCY;
FAST ELECTRONS;
FORWARD BIAS;
FORWARD VOLTAGE;
IRRADIATED DETECTORS;
IRRADIATED SILICON DETECTORS;
MICRO-STRIP DETECTORS;
MODE OF OPERATIONS;
P-TYPE;
P-TYPE SILICON;
RADIATION HARDNESS;
REACTOR NEUTRONS;
REVERSE BIAS VOLTAGE;
STRIP DETECTORS;
SUPER LHC;
HARDNESS;
RADIATION DETECTORS;
SILICON DETECTORS;
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EID: 73649116362
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.08.004 Document Type: Article |
Times cited : (36)
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References (15)
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