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Volumn 636, Issue 1 SUPPL., 2011, Pages
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Study of anomalous charge collection efficiency in heavily irradiated silicon strip detectors
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Author keywords
Charge collection efficiency; Charge multiplication; Impact ionization; Micro strip detectors; P type silicon; Radiation hardness; Super LHC
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Indexed keywords
CHARGE COLLECTION EFFICIENCY;
CHARGE MULTIPLICATION;
MICRO-STRIP DETECTORS;
P-TYPE SILICON;
RADIATION HARDNESS;
SUPER LHC;
BIAS VOLTAGE;
EFFICIENCY;
ELECTRIC FIELDS;
POWER QUALITY;
RADIATION DETECTORS;
SILICON DETECTORS;
SILICON SENSORS;
IMPACT IONIZATION;
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EID: 79955878598
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2010.04.084 Document Type: Conference Paper |
Times cited : (20)
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References (24)
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