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Volumn 426, Issue 1, 1999, Pages 1-15

Radiation hardness of silicon detectors - a challenge from high-energy physics

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CRYSTAL DEFECTS; HIGH ENERGY PHYSICS; RADIATION HARDENING; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES;

EID: 0032664879     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01462-4     Document Type: Article
Times cited : (235)

References (55)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.