Improved conductive atomic force microscopy measurements on organic photovoltaic materials via mitigation of contact area uncertainty

Progress in Photovoltaics: Research and Applications

Volumn 21, Issue 7, 2013, Pages 1433-1443

  Nikiforov, Maxim P ^a   Darling, Seth B ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

charge transport; conductive AFM; contact mechanics; organic photovoltaics

Indexed keywords

CONDUCTIVE AFM; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONTACT MECHANICS; ELECTRICAL AND MECHANICAL PROPERTIES; ORGANIC PHOTOVOLTAIC MATERIALS; ORGANIC PHOTOVOLTAICS; PHOTOVOLTAIC MATERIALS; QUANTITATIVE MEASUREMENT;

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; CONDUCTIVE MATERIALS; DEFORMATION; MECHANICAL PROPERTIES; UNCERTAINTY ANALYSIS;

ELECTRIC PROPERTIES;

EID: 84886093160     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2217     Document Type: Article

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